Jumat, 22 Juli 2011

NJMET Announces Lecture at the DMSMS Show 2011

PRLog (Press Release) – Jul 21, 2011 – NJMET  Vice President Joseph Federico has officially announced a lecture scheduled for the DMSMS show on in Hollywood, FL Wednesday August 31, 2011.

Joseph Federico, of  NJMET in Clifton, NJ will be speaking on the testing of electronic microcircuits and will illustrate the proper electrical testing protocols that should be exercised in testing a component for its functional and parametric performance.    

The test objectives are to exercise the DC and AC Functional and Parametric requirements as indicated in industry specifications. In the cases of military, aerospace and space design, the respective subgroups contained in those documents would suffice for the objective tests.                    my photo and wallpaper "As an example, for a DM74LS244 octal 3-state buffer/line driver/line receiver, a kelvin/continuity test is performed first to check pin contact. Following this initial check, supply current, several input current tests as well as off state output current, short circuit output current and output voltage tests are performed to analysis the DC characteristics," said Joseph Federico.

Once completed, various propogation times are measured along with exercising the device's functional tests in order to analyze the AC characteristics.

"After testing electronic components for over thirty years, I strongly feel that by exercising the proper testing methodologies, the attendees at the DMSMS conference would have more confidence in the distribution 531276856  and performance of these products" said Joseph Federico.

For more information oled technology on mobile phone on the Electrical Testing of Electronic Microcircuits lecture, please call Joseph Federico at NJMET's headquarter in Clifton, NJ (973) 546-5393. Please visit NJMET at http://www.njmetmtl.com.

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